A New Center of Excellence in Characterisation
© CSEM / HE-Arc (HES-SO)
The "Center of Excellence in Characterisation" (CEC), created by the CSEM and HE-Arc, will put at the customers’ disposal a large pallet of various techniques focused on materials characterisation, dimensional measurement and failure mode analysis.
CSEM (Swiss Center for Electronics and Microtechnology) and HE-Arc have created the "Center of Excellence in Characterisation" (CEC) with a view to putting at the customers’ disposal a large pallet of various techniques focused on materials characterisation, dimensional measurement and failure mode analysis. The Center of Excellence in Characterisation brings together the experts and methods from CSEM, and HE Arc in order to meet customers’ requirements, both in space and non-space technologies and applications. HE-Arc (HES-SO) and CSEM are members of the Swiss Space Center.
Contact
Dr. Olha Sereda
CSEM SA
Rue Jaquet-Droz 1
CH-2002 Neuchâtel
T +41 32 720 54 37
E [email protected]
David Grange
HE-ARC
Eplatures-Grise 17
Ch-2300 La Chaux-de-Fonds
T +41 32 930 15 34
E [email protected]
Picture: Confocal microscopy - surface topography of a ceramic film on a polymer substrate.
More information here